Direct measurements of relaxation time scales in Josephson junctions

Year: 1996

Authors: Fabeni P., Linari R., Mugnai D., Nikl M., Pazzi G.P., Ranfagni A., Salvini L., Cristiano R., Frunzio L., Lanzi L., Ventura G., Cetica M., Schulman LS..

Autors Affiliation: Istituto di Ricerca sulle Onde Elettromagnetiche “Nello Carrara” – CNR, 50127 Firenze, Italy;
Istituto di Cibernetica -CNR, Napoli Italy;
Dipartimento di Fisica, Università di Firenze, Firenze, Italy;
Istituto Nazionale di Ottica, Largo E. Fermi 6, 50125 Firenze, Italy;
Clarkson University, Department of Physics, Potsdam, NY, USA

Abstract: We describe an experimental method for obtaining a direct measurement of the lifetime tau(d) of the zero-voltage state in Josephson junctions operating at temperatures around 1 K (thermal regime). The range of tau(d) covered by this method runs typically from 10(-3) to 10(-6) sec. The comparison of the experimental results with the theoretical predictions is also a test of the effective temperature of the junction. The possibility of extending the procedure for the determination of other time-scales, such as those involved in quantum-Zeno effect and traversal time, are discussed.

Journal/Review: SOLID STATE COMMUNICATIONS

Volume: 97 (6)      Pages from: 439  to: 444

KeyWords: superconductors; tunneling;
DOI: 10.1016/0038-1098(95)00704-0

Citations: 8
data from “WEB OF SCIENCE” (of Thomson Reuters) are update at: 2024-04-28
References taken from IsiWeb of Knowledge: (subscribers only)
Connecting to view paper tab on IsiWeb: Click here
Connecting to view citations from IsiWeb: Click here