Molecular orientation in ultrathin films of alpha-sexithiophene on silicon dioxide revealed by spatially resolved confocal spectroscopy

Year: 2005

Authors: Da Como E., Loi M.A., Dinelli F., Murgia M., Biscarini F., Zamboni R., Muccini M.

Autors Affiliation: Istituto per lo Studio dei Materiali Nanostrutturati (ISMN-Bo) Sezione di Bologna, Consiglio Nazionale delle Ricerche, Via Gobetti 101, 40129 Bologna, Italy

Abstract: In organic semiconductors devices like thin film transistors (TFTs), the supra-molecular organization on the substrate is one of the most important parameters to control the charge transport. Unprecedented insights into the molecular orientation of vacuum sublimed ultrathin films of alpha-sexithiophene (T6) on silicon dioxide are revealed by confocal laser scanning microscopy (CLSM) and spectroscopy. By the cross correlation of confocal microscopy and atomic force microscopy measurements, we demonstrated that in films thinner than 2 nm, regions where molecules are oriented perpendicular to the substrate and regions where molecules are parallel to the substrate co-exist. By spatially resolved spectroscopy, we gain information about the supra-molecular organization in ultrathin films. Implications for charge transport in thin film transistors are considered and discussed. (C) 2005 Elsevier B.V. All rights reserved.

Journal/Review: SYNTHETIC METALS

Volume: 155 (2)      Pages from: 287  to: 290

More Information: Erzincan Üniversitesi, EU, IST-2001-38919, IST-2001-33057. – This work was supported by the EU under Contracts IST-2001-33057 (ILO), IST-2001-38919 (PHOENIX). We thank C. Taliani for helpful discussions and P. Fancello for sample preparation. Technical support by P. Mei and T. Bonfiglioli is kindly acknowledged.
KeyWords: Atomic force microscopy; Confocal microscopy; Photoluminescence; Sexithiophene; Thin film
DOI: 10.1016/j.synthmet.2005.09.034

Citations: 5
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