Proceedings of SPIE – The International Society for Optical Engineering: Introduction

Year: 2005

Authors: Ottevaere H., DeWolf P., Wiersma D.S.

Autors Affiliation: Vrije Univ Brussel; Dipartimento di Fisica, Universitá di Firenze, I-50019 Sesto-Fiorentino (FI), Italy; INFM-MATIS, European Laboratory for Non-linear Spectroscopy, Sesto Fiorentino (Florence), Italy

Abstract: [No abstract available]


KeyWords: metrology
DOI: 10000000000