Intensity-noise and frequency-noise measurements in 2 µm Tm-Ho:KYF laser
Authors: Galzerano G., Sani E., Toncelli A., Tonelli M., Svelto C., Bava E., Taccheo S., Laporta P.
Autors Affiliation: IFN-CNR, Dipartimento di Fisica, INFM, Piazza L. da Vinci 32, Italy; NEST – INFM, Dipartimento di Fisica, Università di Pisa, Via F. Buonarroti 2, 56100 Pisa, Italy; Politecnico di Milano, Dipartimento di Elettronica, INFM, Via Ponzio, 34/5, 20133 Milan, Italy
Abstract: The development and characterization of single-mode 2-µm Tm-Ho:KYF 4 (KYF) laser is here presented. In particular, both frequency noise and relative intensity noise measurements of the single-frequency oscillator have been realized. From the power spectral density of the frequency noise an emission linewidth of ~100 kHz has been measured for the 2 µm source, whereas the intensity noise spectrum is quantum-noise limited for Fourier frequencies higher than 1 MHz.
KeyWords: Frequency noise measurements; Intensity noise measurement; Multiphase ring oscillators; NIR oscillators, CMOS integrated circuits; Crystals; Gallium compounds; Heat sinks; Laser resonators; Mirrors; Oscillators (mechanical); Quantum theory; Reflection; Spectroscopy; Spurious signal noise; Thermoelectricity, Solid state lasersDOI: 10.1109/IMTC.2004.1351563