Schlieren imaging of inverted domains in congruent lithium niobate

Year: 2005

Authors: Paturzo M., Ferraro P., Grilli S., De Natale P., De Nicola S., Finizio A., Mailis S., Eason R.W.

Autors Affiliation: Istituto Nazionale di Ottica Applicata, Via Campi Flegrei 34, 80078 Pozzuoli (Na), Italy;
Istituto di Cibernetica E. Caianiello del CNR, Via Campi Flegrei 34, 80078 Pozzuoli (Na), Italy;
Optoelectronics Research Centre, University of Southampton, Highfield, Southampton, SO17 IBJ, United Kingdom

Conference title: 2005 Conference on Lasers and Elctro-Optics Europe
Place: Munich; Germany

More Information: DOI: 10.1109/CLEOE.2005.1568056

KeyWords: Electrooptical effects; Imaging techniques; Rapid thermal annealing; Refractive index;