Processing and structural properties of random oriented lead lanthanum zirconate titanate thin films

Year: 2015

Authors: Araújo E.B., Nahime B.O., Melo M., Dinelli F., Tantussi F., Baschieri P., Fuso F., Allegrini M.

Autors Affiliation: Univ Estadual Paulista, UNESP, Dept Quim & Fis, Fac Engn Ilha Solteira, BR-15385000 Ilha Solteira, SP, Brazil; CNR, INO UOS A Gozzini, Area Ric Pisa S Cataldo, I-56124 Pisa, Italy; Univ Pisa, Dipartimento Fis Enrico Fermi, I-56127 Pisa, Italy

Abstract: Polycrystalline lead lanthanum zirconate titanate (PLZT) thin films have been prepared by a polymeric chemical route to understand the mechanisms of phase transformations and map the microstructure and elastic properties at the nanoscale in these films. X-ray diffraction, atomic force microscopy (AFM) and ultrasonic force microscopy (UFM) have been used as investigative tools. On one side, PLZT films with mixed-phase show that the pyrochlore phase crystallizes predominantly in the bottom film-electrode interface while a pure perovskite phase crystallizes in top film surface. On the contrary, pyrochlore-free PLZT films show a non-uniform microstrain and crystallite size along the film thickness with a heterogeneous complex grainy structure leading to different elastic properties at nanoscale. (C) 2014 Elsevier Ltd. All rights reserved.


Volume: 61      Pages from: 26  to: 31

More Information: We would like to express our gratitude to the Brazilian and Italian agencies for their financial support (Bilateral CNPq-CNR Project: 490436/2011-0). A research grant from CNPq (Process number: 307607/2009-7 and Project No 400677/2014-8) for E.B. Araujo is acknowledged. The financial support from FAPESP (Project No 2014/19807-4) is also acknowledged.
KeyWords: Atomic force microscopy; Chemical synthesis; Thin films
DOI: 10.1016/j.materresbull.2014.09.055

Citations: 5
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