INTEGRATED PHOTONICS Device-level photonic testing
Year: 2015
Authors: Burresi M.
Autors Affiliation: Istituto Nazionale di Ottica (CNR-INO), Largo Fermi 6, 50125 Firenze (FI),Italy and the European Laboratory for
Non-linear Spectroscopy (LENS), 50019 Sesto Fiorentino (FI), Italy
Abstract: Non-invasive, multispectral characterization of integrated photonic circuits paves the way towards optical methodologies ready for industrial applications.
Journal/Review: NATURE PHOTONICS
Volume: 9 (1) Pages from: 8 to: 9
KeyWords: photonic circuitsDOI: 10.1038/nphoton.2014.313ImpactFactor: 31.167Citations: 1data from “WEB OF SCIENCE” (of Thomson Reuters) are update at: 2024-12-08References taken from IsiWeb of Knowledge: (subscribers only)Connecting to view paper tab on IsiWeb: Click hereConnecting to view citations from IsiWeb: Click here