Optical micro-profilometry for archeology
Year: 2005
Authors: Carcagnì P., Daffara C., Fontana R., Gambino M.C., Mastroianni M., Mazzotta C., Pampaloni E., Pezzati L.
Autors Affiliation: Istituto Nazionale di Ottica Applicata, Sez. di Lecce, via Barsanti, 73010 Arnesano (LE), Italy;
Istituto Nazionale di Ottica Applicata, Largo E. Fermi 6, 50125 Firenze, Italy;
Dipartimento di Beni Culturali, Università di Lecce, via D. Birago 64, 73100 Lecce, Italy
Abstract: A quantitative morphological analysis of archaeological objects represents an important element for historical evaluations, artistic studies and conservation projects.
At present, a variety of contact instruments for high-resolution surface survey is available on the market, but because of their invasivity they are not well received in the field of artwork conservation. On the contrary, optical testing techniques have seen a successful growth in last few years due to their effectiveness and safety. In this work we present a few examples of application of high-resolution 3D techniques for the survey of archaeological objects. Measurements were carried out by means of an optical micro-profilometer composed of a commercial conoprobe mounted on a scanning device that allows a maximum sampled area of 280×280 mm2. Measurements as well as roughness calculations were carried out on selected areas, representative of the differently degraded surface, of an ellenestic bronze statue to document the surface corrosion before restoration intervention started.
Two highly-corroded ancient coins and a limestone column were surveyed to enhance the relief of inscriptions and drawings for dating purposes. High-resolution 3D survey, beyond the faithful representation of objects, makes it possible to display the surface in an image format that can be processed by means of image processing software. The application of digital filters as well as rendering techniques easies the readability of the smallest details.
Journal/Review: PROCEEDINGS OF SPIE
Volume: 5857 Pages from: 58570F-1 to: 58570F-11
KeyWords: 3D survey; roughness; digital model; micro-profilometer; scanning deviceDOI: 10.1117/12.612527