Measuring the deformations of a scattering surface with a general purpose interferometer

Year: 1996

Authors: Trivi M., Greco V., Hoffer L., Molesini G.

Autors Affiliation: Istituto Nazionale di Ottica, Largo E. Fermi 6, 50125 Firenze, Italy

Abstract: The present work demonstrates the use of a general purpose interferometer to measure the deformations of a scattering surface by processing speckle patterns instead of smooth wavefronts. The operation of the interferometer are re- programmed to include algorithms adapted to handling speckle patterns. Details of the measuring operation are described, limits of applicability are discussed, and experimental results are presented. ©2004 Copyright SPIE – The International Society for Optical Engineering.

Conference title:

KeyWords: General purpose; Scattering surface; Speckle patterns, Deformation; Optical testing; Speckle; Interferometers; Non destructive testing