Photorefractive effect in LiNbO3-based integrated-optical circuits for continuous variable experiments
Authors: Mondain F., Brunel F., Hua X., Gouzien E., Zavatta A., Lunghi T., Doutre F., De Micheli, MP., Tanzilli S., D’Auria V.
Autors Affiliation: Univ Cote dAzur, CNRS, Inst Phys Nice INPHYNI, Parc Valrose, F-06108 Nice 2, France; Ist Nazl Ott INO CNR, Largo Enrico Fermi 6, I-50125 Florence, Italy; Univ Firenze, LENS, I-50019 Florence, Italy; Univ Firenze, Dept Phys, I-50019 Florence, Italy
Abstract: We investigate the impact of the photorefractive effect on lithium niobate integrated quantum photonic circuits dedicated to continuous variable on-chip experiments. The circuit main building blocks, i.e. cavities, directional couplers, and periodically poled nonlinear waveguides, are studied. This work demonstrates that photorefractivity, even when its effect is weaker than spatial mode hopping, might compromise the success of on-chip quantum photonics experiments. We describe in detail the characterization methods leading to the identification of this possible issue. We also study to which extent device heating represents a viable solution to counter this effect. We focus on photorefractive effect induced by light at 775 nm, in the context of the generation of non-classical light at 1550 nm telecom wavelength. (C) 2020 Optical Society of America under the terms of the OSA Open Access Publishing Agreement
Journal/Review: OPTICS EXPRESS
Volume: 28 (16) Pages from: 23176 to: 23188