Scientific Results

Optical properties of silicon-implanted polycrystalline diamond membranes

Year: 2020

Authors: Kambalathmana H., Flatae A.M., Hunold L., Sledz F., Müller J., Hepp M., Schmuki P., Killian M.S., Lagomarsino S., Gelli N., Sciortino S., Giuntini L., Wörner E., Wild C., Butz B., Agio M.

Autors Affiliation: Laboratory of Nano-Optics, University of Siegen, 57072, Siegen, Germany; Center for Micro- and Nanochemistry and Engineering (Cμ), University of Siegen, 57068, Siegen, Germany; Micro- and Nanoanalytics Group, University of Siegen, 57076, Siegen, Germany; Chair for Surface Science and Corrosion, FAU Erlangen, 91058, Erlangen, Germany; Chemistry and Structure of Novel Materials, University of Siegen, 57076, Siegen, Germany; Istituto Nazionale di Fisica Nucleare, Sezione di Firenze, 50019, Sesto Fiorentino, Italy; Department of Physics and Astronomy, University of Florence, 50019 Sesto Fiorentino, Italy; Diamond Materials GmbH, 79108, Freiburg, Germany; National Institute of Optics (INO), National Research Council (CNR), 50125, Florence, Italy

Abstract: We investigate the optical properties of polycrystalline diamond membranes containing silicon-vacancy (SiV) color centers in combination with other nano-analytical techniques. We analyze the correlation between the Raman signal, the SiV emission, and the background luminescence in the crystalline grains and in the grain boundaries, identifying conditions for the addressability of single SiV centers. Moreover, we perform a scanning transmission electron microscopy (STEM) analysis, which associates the microscopic structure of the membranes and the evolution of the diamond crystals along the growth direction with the photoluminescence properties, as well as a time-of-flight secondary ion mass spectrometry (ToF-SIMS) to address the distribution of Si in implanted and un-implanted membranes. The results of the STEM and ToF-SIMS studies are consistent with the outcome of the optical measurements and provide useful insight into the preparation of polycrystalline samples for quantum nano-optics.

Journal/Review: CARBON

Volume: 174      Pages from: 295  to: 304

KeyWords: CVD diamond Films, Ion implantation, Silicon-vacancy center, Spectroscopy and confocal mapping, STEM analysis, ToF-SIMS analysis
DOI: 10.1016/j.carbon.2020.12.031