Focused Gaussian beam in the paraxial approximation
Authors: Das A., Soltani N., Agio M.
Autors Affiliation: Laboratory of Nano-Optics and Cμ, University of Siegen, 57072 Siegen, Germany;
National Institute of Optics (INO), National Research Council (CNR), 50125 Florence, Italy
Abstract: A focused Gaussian beam represents a case of highly practical importance in many areas of optics and photonics. We derive analytical expressions for a focused Gaussian beam in the paraxial approximation, considering an arbitrary lens filling factor. We discuss the role of higher-order Bessel functions of the first kind in defining the electric field in the focal region.
Journal/Review: OPTICS LETTERS
Volume: 45 (24) Pages from: 6752 to: 6754