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Author: Dinelli Franco Category: Conference proceedings 

1) Influence of the dielectric and of the active layer doping on the FET mobility in PPV-based devices in JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICS
By: Todescato F., Capelli R., Dinelli F., Murgia M., Camaioni N., Yang M., Muccini M. Year: 2007 (IF.: 3.934 )

2) Focused ion beam as tool for atomic force microscope (AFM) probes sculpturing in JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICS
By: Menozzi C., Calabri L., Facci P., Pingue P., Dinelli F., Baschieri P. Year: 2008 (Cit.: 5 DOI: 10.1088/1742-6596/126/1/012070)

3) Seeing the invisible – ultrasonic force microscopy for true subsurface elastic imaging of semiconductor nanostructures with nanoscale resolution in JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICS
By: Kolosov O.V., Dinelli F., Krier A., Henini M., Hayne M., Pinque P. Year: 2012 (Cit.: 1 )

4) Nanometre scale 3D nanomechanical imaging of semiconductor structures from few nm to sub-micrometre depths in JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICS
By: Kolosov O.V., Dinelli F., Robson A., Krier A., Hayne M., Fal’ko VI., Henini M. Year: 2015 5) Scanning ion conductance microscopy (SICM): from measuring cell mechanical properties to guiding neuron growth in JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICS
By: Pellegrino M., Orsini P., Pellegrini M., Tognoni E., Ascoli C., Baschieri P., Dinelli F., Year: 2013 ( DOI: 10.1117/12.2021541)

6) Mapping nanomechanical phenomena in graphene nanostructures using force modulation and ultrasonic force microscopy in JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICS
By: Kolosov O., Kay N., Robinson B., Rosamond M., Zeze D., Falko V., Dinelli F. Year: 2012 7) Use of scanning ion conductance microscopy to map elastic properties of cell membranes in JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICS
By: Pellegrino M., Orsini P., Pellegrini M., Tognoni E., Baschieri P., Dinelli F., Petracchi D., Ascoli C. Year: 2011 ( DOI: 10.1109/IWBP.2011.5954800)

8) Interazione sonda-campione nella microscopia a scansione di conduttanza ionica utilizzata per la guida dei coni di crescita neuronali in JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICS
By: Pellegrini M., Orsini P., Pellegrini M., Baschieri P., Dinelli F., Petracchi D., Tognoni E., Ascoli C. Year: 2010 9) Scanning Probe Microscopy techniques for the characterization of polymer thin films and composites in JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICS
By: Dinelli F. Year: 2010