Femtosecond temperature measurements of laser-shocked copper deduced from the intensity of the x-ray thermal diffuse scattering
Year: 2025
Authors: Wark JS., Peake DJ., Stevens T., Heighway PG., Ping Y., Sterne P., Albertazzi B., Ali SJ., Antonelli L., Armstrong MR., Baehtz C., Ball OB., Banerjee S., Belonoshko AB., Bolme CA., Bouffetier V., Briggs R., Buakor K., Butcher T., Cafiso SD., Cerantola V., Chantel J., Di Cicco A., Coleman AL., Collier J., Collins G., Comley AJ., Coppari F., Cowan TE., Cristoforetti G., Cynn H., Descamps A., Dorchies F., Duff MJ., Dwivedi A., Edwards C., Eggert JH., Errandonea D., Fiquet G., Galtier E., Garcia AL., Ginestet H., Gizzi L., Gleason A., Goede S., Gonzalez JM., Gorman MG., Harmand M., Hartley N., Hernandez-Gomez C., Higginbotham A., Hoeppner H., Humphries OS., Husband RJ., Hutchinson TM., Hwang H., Keen DA., Kim J., Koester P., Konopkova Z., Kraus D., Krygier A., Labate L., Lazicki AE., Lee Y., Liermann HP., Mason P., Masruri M., Massani B., Mcbride EE., Mcguire C., Mchardy JD., Mcgonegle D., Mcwilliams RS., Merkel S., Morard G., Nagler B., Nakatsutsumi M., Nguyen-Cong K., Norton AM., Oleynik II., Otzen C., Ozaki N., Pandolfi S., Pelka A., Pereira KA., Phillips JP., Prescher C., Preston TR., Randolph L., Ranjan D., Ravasio A., Redmer R., Rips J., Santamaria-Perez D., Savage DJ., Schoelmerich M., Schwinkendorf JP., Singh S., Smith J., Smith RF., Sollier A., Spear J., Spindloe C., Stevenson M., Strohm C., Suer TA., Tang M., Toncian M., Toncian T., Tracy SJ., Trapananti A., Tschentscher T., Tyldesley M., Vennari CE., Vinci T., Vogel SC., Volz TJ., Vorberger J., Willman JT., Wollenweber L., Zastrau U., Brambrink E., Appel K., Mcmahon MI.
Autors Affiliation: Univ Oxford, Dept Phys, Clarendon Lab, Oxford, England; Lawrence Livermore Natl Lab, Livermore, CA USA; Ecole Polytech, CNRS, LULI, Lab Utilisat Lasers Intenses, F-91128 Palaiseau, France; Univ York, Sch Phys Engn & Technol, York, England; Helmholtz Zent Dresden Rossendorf HZDR, Dresden, Germany; Univ Edinburgh, SUPA, Ctr Sci Extreme Condit, Sch Phys & Astron, Edinburgh EH9 3JZ, Midlothian, Scotland; UKRI STFC Rutherford Appleton Lab, Cent Laser Facil Res Complex, Didcot, Oxon, England; Nanjing Univ, Frontiers Sci Ctr Crit Earth Mat Cycling, Sch Earth Sci & Engn, Nanjing 210023, Peoples R China; Alamos Natl Lab, Los Alamos, NM USA; European XFEL, Schenefeld, Germany; Univ Studi Milano Bicocca, Dipartimento Sci Ambiente & Terra, I-20126 Milan, Italy; Univ Lille, CNRS, INRAE, Cent Lille,UMR 8207,UMET,Unite Mat & Transformat, F-59000 Lille, France; Univ Camerino, Sch Sci & Technol, Phys Div, Camerino, Italy; Univ Rochester, Lab Laser Energet LLE, Rochester, NY 14627 USA; Atom Weap Estab AWE, Aldermaston, England; Consiglio Nazl Ric CNR, Ist Nazl Ott INO, Via Campi Flegrei 34, I-80078 Pozzuoli, Italy; Queens Univ Belfast, Sch Math & Phys, Univ Rd, Belfast, North Ireland; Univ Bordeaux, CELIA, CNRS, CEA, F-33405 Talence, France; Univ Valencia, Dept Fis Aplicada, ICMUV, E-46100 Burjassot, Spain; Sorbonne Univ, Inst Mineral Phys Materiaux & Cosmochimie, Museum Natl Dhistoire Naturelle, UMR CNRS 7590, Paris, France; SLAC Natl Accelerator Lab, Stanford, CA USA; Ist Nazl Ott Consiglio Nazl Ric INO CNR, Via Moruzzi 1, I-56124 Pisa, Italy; Univ S Florida, Dept Phys, Tampa, FL USA; HESAM Univ, Arts & Metiers Inst Technol, CNRS, CNAM,PIMM, Paris, France; Deutsch Elektronen Synchrotron DESY, Zeuthen, Germany; STFC Rutherford Appleton Lab, ISIS Facil, Didcot OX11 0QX, England; Hanyang Univ, Dept Phys, Ansan, South Korea; Univ Rostock, Inst Phys, Rostock, Germany; Yonsei Univ, Dept Earth Syst Sci, Seoul, South Korea; Univ Savoie Mont Blanc, Univ Grenoble Alpes, Univ Gustave Eiffel, IRD,CNRS,ISTerre, F-38000 Grenoble, France; Albert Ludwigs Univ Freiburg, Betriebswirtschaft Steuerlehre, Freiburg, Germany; Osaka Univ, Grad Sch Engn Sci, Osaka, Japan; Univ Massachusetts, Dept Chem, Amherst, MA 01003 USA; Paul Scherrer Inst, Villigen, Switzerland; CEA, DAM, DIF, Arpajon, France; Univ Paris Saclay, CEA, Lab Matiere Condit Extremes, F-91680 Bruyeres Le Chatel, France; Carnegie Inst Sci, Earth & Planets Lab, Washington, DC 20015 USA.
Abstract: We present 50-fs, single-shot measurements of the x-ray thermal diffuse scattering (TDS) from copper foils that have been shocked via nanosecond laser ablation up to pressures above similar to 135 GPa. We hence deduce the x-ray Debye-Waller factor, providing a temperature measurement. The targets were laser-shocked with the DiPOLE 100-X laser at the High Energy Density endstation of the European X-ray Free-Electron Las er. Single x-ray pulses, with a photon energy of 18 keV, were scattered from the samples and recorded on Varex detectors. Despite the targets being highly textured (as evinced by large variations in the elastic scattering) and with such texture changing upon compression, the absolute intensity of the azimuthally averaged inelastic TDS between the Bragg peaks is largely insensitive to these changes, and allowing for both Compton scattering and the low-level scattering from a sacrificial ablator layer provides a reliable measurement of T/Theta(2)(D), where Theta(D) is the Debye temperature. We compare our results with the predictions of the SESAME 3336 and LEOS 290 equations of state for copper and find good agreement within experimental errors. We, thus, demonstrate that single-shot temperature measurements of dynamically compressed materials can be made via thermal diffuse scattering of XFEL radiation. (c) 2025 Author(s). All article content, except where otherwise noted, is licensed under a Creative Commons Attribution-NonCommercialNoDerivs 4.0 International (CC BY-NC-ND) license (https://creativecommons.org/licenses/by-nc-nd/4.0/).
Journal/Review: JOURNAL OF APPLIED PHYSICS
Volume: 137 (15) Pages from: 155904-1 to: 155904-17
More Information: J.S.W. and P.G.H. gratefully acknowledge support from EPSRC under research grant EP/X031624/1. D.J.P. and T.S. appreciate support from AWE via the Oxford Centre for High Energy Density Science (OxCHEDS).KeyWords: Energy Density Instrument; Compression Experiments; Dynamic Compression; Solid Iron; Diffraction; Visualization; SiliconDOI: 10.1063/5.0256844
