Confocal luminescence microscopy characterization of optical waveguides produced by ion beam irradiation on LiF

Year: 2003

Authors: Pelli S., Brenci M., Calzolai R., Quercioli F., Tiribilli B., Vassalli M., Ghirelli A., Cremona M., Pereira J.A.M., Righini G.C.

Autors Affiliation: Nello Carrara” Institute of Applied Physics, IFAC – CNR, Optoelectronics & Photonics Dept., via Panciatichi 64, 50127 Firenze, Italy;
Istituto Nazionale di Ottica Applicata, Lab. di Biofotonica, Largo E. Fermi 6, 50125 Firenze, Italy;
Departamento de Física, Pontifícia Universidade Católica do Rio de Janeiro,
PUC-Rio, Rio de Janeiro, Brazil
dUFRJ, Institute of Physics, CP 68528, 21945-970 Rio de Janeiro, RJ, Brazil

Abstract: Optical waveguides in lithium fluoride (LiF) crystals have been obtained by He+ ion beam irradiation. The waveguides have been characterized by several techniques. In particular, we describe here the application of confocal microscopy to their characterization and show the first results obtained. We have also carried out a preliminary evaluation of the potential of this technique for the assessment of structural and spectroscopic characteristics of the waveguides.

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KeyWords: Computer software; Crystals; Ion beams; Irradiation; Lithium compounds; Luminescence; Microscopic examination; Spectroscopic analysis, Confocal luminescence microscopy, Optical waveguides
DOI: 10.1117/12.478329

Citations: 2
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