Defect detection in textured materials by optical filtering with structured detectors and self-adaptable masks

Anno: 1996

Autori: Ciamberlini C., Francini F., Longobardi G., Sansoni P., Tiribilli B.

Affiliazione autori: Istituto Nazionale di Ottica, Largo E. Fermi 6, 50125 Firenze, Italy;
Centro di Eccellenza Optronica, Campi Bisenzio 500013 Firenze, Italy

Abstract: An optical method using Fourier transformation and spatial filtering is used to reveal defects in textured materials in real time. New optical structured filter types were developed including a self-adaptable mask made of photochromic polymers. The characteristics of these materials make possible very promising applications in pattern recognition such as that represented by a fabric. (C) 1996 Society of Photo-Optical Instrumentation Engineers.


Volume: 35 (3)      Da Pagina: 838  A: 844

Parole chiavi: Filter; Fourier transform; Mask; Pattern recognition; Texture
DOI: 10.1117/1.600663

Citazioni: 28
dati da “WEB OF SCIENCE” (of Thomson Reuters) aggiornati al: 2023-12-10
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