Growth and spectroscopic analysis of Tm, Ho : KYF(4)
Anno: 2004
Autori: Sani E., Toncelli A., Tonelli M., Traverso F.
Affiliazione autori: NEST-INFM Dipartimento di Fisica, Università di Pisa, via Buonarroti, 2-50127 Pisa, Italy
Abstract: Single crystals of lasing Tm, Ho:KYF(4) were successfully grown by the Czochralski method. A complete polarized spectroscopic investigation is given and it is shown that the inhomogeneous broadening of the spectra of rare earth ions can be ascribed to a disordered character of the KYF crystalline structure.
Giornale/Rivista: JOURNAL OF PHYSICS-CONDENSED MATTER
Volume: 16 (3) Da Pagina: 241 A: 252
Parole chiavi: Crystal defects; Crystal growth from melt; Crystal symmetry; Ions; Light polarization; Rare earth elements; Spectroscopic analysis; Thulium compounds, Disordered characters; Rare earth ions; Trigonal noncentrosymmetric structure, Solid state lasersDOI: 10.1088/0953-8984/16/3/005Citazioni: 14dati da “WEB OF SCIENCE” (of Thomson Reuters) aggiornati al: 2024-05-05Riferimenti tratti da Isi Web of Knowledge: (solo abbonati) Link per visualizzare la scheda su IsiWeb: Clicca quiLink per visualizzare la citazioni su IsiWeb: Clicca qui