Nanocrystals as precursors for flexible functional films
Anno: 2005
Autori: Cademartiri L., von Freymann G., Arsenault AC., Bertolotti J., Wiersma D., Kitaev V., Ozin GA.
Affiliazione autori: Univ Toronto, Dept Chem, Lash Miller Chem Labs, Mat Chem Res Grp, Toronto, ON M5S 3H6, Canada; European Lab Nonlinear Spectroscopy, I-50019 Florence, Italy; INFM, I-50019 Florence, Italy;
Wilfrid Laurier Univ, Dept Chem, Waterloo, ON N2L 3C5, Canada
Abstract: A general strategy for obtaining tailorable and patternable films of densely packed nanocrystals, was investigated using the as-prepared nanocrystals as precursors. A solution containing PbS nanocrystals and the excess pbCl 2-OLA complex was repeatedly drop-cast onto a glass slide until a thick film was formed. The film composed of densely packed nanocrystals separated by the OLA capping ligands. The film was then exposed to a 5-W air plasma for 48 h, after which it was lifted off the substrate without damage. The morphology and the nanoscopic organization of the films was investigated using TEM and scanning electron microscopy (SEM). The nanocrystals formed ordered superstructures, with cubic symmetry. The peak in the small-angle X-ray scattering (SAXS) curve indicated the presence of a residual order in the packing of the nanocrystals. The surface-to-surface distance between nanocrystals was found between 1 and 3 nm.
Giornale/Rivista: SMALL
Volume: 1 (12) Da Pagina: 1184 A: 1187
Parole chiavi: Crystals; Lead compounds; Molecular structure; Scanning electron microscopy; Substrates; Transmission electron microscopy, Lead chalcogenides; Lead sulfides; Nanocrystals; Plasma chemistry, Nanostructured materials, argon; cadmium chloride; cadmium derivative; cadmium sulfide; ion; nanomaterial; nanoparticle; sulfide, article; chemistry; Fourier analysis; instrumentation; light; materials testing; methodology; nanotechnology; scanning electron microscopy; temperature; transmission electron microscopy; X ray diffraction, Argon; Cadmium Chloride; Cadmium Compounds; Fourier Analysis; Ions; Light; Materials Testing; Microscopy, Electron, Scanning; Microscopy, Electron, Transmission; Nanoparticles; Nanostructures; Nanotechnology; Sulfides; Temperature; X-Ray DiffractionDOI: 10.1002/smll.200500206Citazioni: 38dati da “WEB OF SCIENCE” (of Thomson Reuters) aggiornati al: 2024-05-12Riferimenti tratti da Isi Web of Knowledge: (solo abbonati) Link per visualizzare la scheda su IsiWeb: Clicca quiLink per visualizzare la citazioni su IsiWeb: Clicca qui