Fringe projection based on Moiré method for measuring aberration of axially symmetric optics
Anno: 2000
Autori: De Nicola S., Ferraro P.
Affiliazione autori: Istituto di Cibernetica del CNR, via Toiano 6, 80072 Arco Felice, Italy;
Istituto Nazionale di Ottica Applicata, Sez. di Napoli, c/o Istituto di Cibernetica del CNR, via Toiano 6, 80072 Arco Felice, Italy
Abstract: We present a new approach based on a very simple optical interferometric configuration that can be useful for measuring wave front aberrations in optical components having axial symmetry. The optical configuration requires only two mutually coherent plane wave fronts transmitted through or reflected by the optical component under test. The method can be considered as an interferometric fringe projection method. It can also be interpreted also as a reversal shear interferometer. The finite Moiré beating between the interferograms and the CCD array is used to subtract a linear carrier introduced by defocus and tilt making the presence of third order coma and spherical aberrations more evident. Applications of the technique for measuring aberrations of simple biconvex spherical lens and a plano-spherical laser micro-cavity are reported.
Giornale/Rivista: OPTICS COMMUNICATIONS (PRINT)
Volume: 185 Da Pagina: 285 A: 293
Parole chiavi: reflective grating interferometerCitazioni: 12dati da “WEB OF SCIENCE” (of Thomson Reuters) aggiornati al: 2024-05-12Riferimenti tratti da Isi Web of Knowledge: (solo abbonati) Link per visualizzare la scheda su IsiWeb: Clicca quiLink per visualizzare la citazioni su IsiWeb: Clicca qui