Focused Gaussian beam in the paraxial approximation

Anno: 2020

Autori: Das A., Soltani N., Agio M.

Affiliazione autori: Laboratory of Nano-Optics and Cμ, University of Siegen, 57072 Siegen, Germany;
National Institute of Optics (INO), National Research Council (CNR), 50125 Florence, Italy

Abstract: A focused Gaussian beam represents a case of highly practical importance in many areas of optics and photonics. We derive analytical expressions for a focused Gaussian beam in the paraxial approximation, considering an arbitrary lens filling factor. We discuss the role of higher-order Bessel functions of the first kind in defining the electric field in the focal region.

Giornale/Rivista: OPTICS LETTERS

Volume: 45 (24)      Da Pagina: 6752  A: 6754

Maggiori informazioni: Universitat Siegen; Deutsche Forschungsgemeins chaft (INST 221/118-1 FUGG); Bundesministerium fur Bildung und Forschung (13N14746).
Parole chiavi: focused beams; paraxial approximation
DOI: 10.1364/OL.414302

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